XRD modular system

Malvern Panaytical Empyrean Series 3 diffraction system configured for a very wide range of applications and experiments. The system is easy to use and at the same time allows you to get the highest quality results.

Possible analyzes:

• Phase (qualitative) analysis of inorganic and organic powdery, solid and pasty materials
• Structural and quantitative analysis by the Rietveld method
• Phase quantitative and semiquantitative analysis
• Study of structural changes under the influence of high temperature (up to 1200OC)
• Phase analysis of thin films (crystalline and amorphous)
• Sample mapping (microdiffraction) with a spot size of 100 microns
• Determination of nanoparticles' size, shape and size distribution by the low-angle scattering method (SAXS) for samples that can be solids, powders, emulsions, colloids, solutions of macromolecules of low concentrations, pasty material, etc.
• 2D SAXS for determining the order and orientation of nanoparticles
• Reflectometry for determining the thickness, roughness and density of thin films and multilayer thin film systems
• 2D GISAXS method for studying thin films, especially films consisting of nanoparticles or nanostructures
• Computed tomography (CT) of small objects with 3D reconstruction
• Determination of crystallite size
• Determination of residual stress in the material (Residual Stress)
• Analysis of the orientation of crystallites in the material (Texture)